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november 2016 docid029957 rev 2 1 / 13 this is information on a product in full production. www.st.com STF4N90K5 n - channel 900 v, 1.90 typ., 4 a mdmesh? k5 power mosfet in a to - 220fp package datasheet - production data figure 1 : internal schematic diagram features order code v ds r ds(on) max. i d STF4N90K5 900 v 2.10 4 a ? industrys lowest r ds(on) x area ? industrys best fom (figure of merit) ? ultra - low gate charge ? 100% avalanche tested ? zener - protected applications ? switching applications description this very high voltage n - channel power mosfet is designed using mdmesh? k5 technology based on an innovative proprietary vertical structure. the result is a dramatic r eduction in on - resistance and ultra - low gate charge for applications requiring superior power density and high efficiency. table 1: device summary order code marking package packing STF4N90K5 4n90k5 to - 220 fp tube am15572v1_no_tab d(2) g(1) s(3) t o-220f p
contents STF4N90K5 2 / 13 docid029957 rev 2 contents 1 electrical ratings ................................ ................................ ............. 3 2 electrical characteristics ................................ ................................ 4 2.1 electrical characteri stics (curves) ................................ ...................... 6 3 test circuits ................................ ................................ ..................... 8 4 package information ................................ ................................ ....... 9 4.1 to - 220fp package information ................................ ...................... 10 5 revision history ................................ ................................ ............ 12
STF4N90K5 electrical ratings docid029957 rev 2 3 / 13 1 electrical ratings table 2: absolute maximum ratings symbol parameter value unit v gs gate - source voltage 30 v i d drain current (continuous) at t c = 25 c 4 (1) a i d drain current (continuous) at t c = 100 c 2.5 (1) a i d (2) drain current (pulsed) 16 a p tot total dissipation at t c = 25 c 20 w dv/dt (3) peak diode recovery voltage slope 4.5 v/ns dv/dt (4) mosfet dv/dt ruggedness 50 v iso insulation withstand voltage (rms) from all three leads to external heat sink (t = 1 s; tc = 25 c) 2500 v t j operating junction temperature range - 55 to 150 c t stg storage temperature range notes: (1) limited by package (2) pulse width limited by safe operating area (3) i sd 4 a, di/dt 100 a/s; v ds peak < v (br)dss , v dd = 450 v. (4) v ds 720 v table 3: thermal data symbol parameter value unit r thj - case thermal resistance junction - case 6.25 c/w r thj - amb thermal resistance junction - ambient 62.5 c/w table 4: avalanche characteristics symbol parameter value unit i ar avalanche current, repetitive or not repetitive (pulse width limited by t jmax ) 1 a e as single pulse avalanche energy (starting t j = 25 c, i d = i ar , v dd = 50 v) 160 mj
electrical characteristics STF4N90K5 4 / 13 docid029957 rev 2 2 electrical characteristics t c = 25 c unless otherwise specified table 5: on/off - state symbol parameter test conditions min. typ. max. unit v (br)dss drain - source breakdown voltage v gs = 0 v, i d = 1 ma 900 v i dss zero gate voltage drain current v gs = 0 v, v ds = 900 v 1 a v gs = 0 v, v ds = 900 v t c = 125 c (1) 50 a i gss gate body leakage current v ds = 0 v, v gs = 20 v 10 a v gs(th) gate threshold voltage v dd = v gs , i d = 100 a 3 4 5 v r ds(on) static drain - source on - resistance v gs = 10 v, i d = 1.5 a 1.90 2.10 ? notes: (1) defined by design, not subject to production test. table 6: dynamic symbol parameter test conditions min. typ. max. unit c iss input capacitance v ds = 100 v, f = 1 mhz, v gs = 0 v - 173 - pf c oss output capacitance - 17.9 - pf c rss reverse transfer capacitance - 1 - pf c o(tr) (1) equivalent capacitance time related v ds = 0 to 720 v, v gs = 0 v - 29 - pf c o(er) (2) equivalent capacitance energy related - 11 - pf r g intrinsic gate resistance f = 1 mhz, i d = 0 a - 15.5 - ? q g total gate charge v dd = 720 v, i d = 3 a v gs = 10 v (see figure 15: "test circuit for gate charge behavior" ) - 5.3 - nc q gs gate - source charge - 1.45 - nc q gd gate - drain charge - 2.8 - nc notes: (1) time related is defined as a constant equivalent capacitance giving the same charging time as c oss when v ds increases from 0 to 80% v dss . (2) energy related is defined as a constant equivalent capacitance giving the same stored energy as c oss when v ds inc reases from 0 to 80% v dss .
STF4N90K5 electrical characteristics docid029957 rev 2 5 / 13 table 7: switching times symbol parameter test conditions min. typ. max. unit t d(on) turn - on delay time v dd = 450 v, i d = 1.50 a, r g = 4.7 ? ; v gs = 10 v (see figure 14: "test circuit for resistive load switching times" and figure 19: "switching time waveform" ) - 10.5 - ns t r rise time - 11.8 - ns t d(off) turn - off delay time - 26.4 - ns t f fall time - 25.5 - ns table 8: source - drain diode symbol parameter test conditions min. typ. max. unit i sd source - drain current - 4 a i sdm (1) source - drain current (pulsed) - 16 a v sd (2) forward on voltage i sd = 3 a, v gs = 0 v - 1.5 v t rr reverse recovery time i sd = 3 a, di/dt = 100 a/s,v dd = 60 v (see figure 16: "test circuit for inductive load switching and diode recovery times" ) - 289 ns q rr reverrse recovery charge - 1.56 c i rrm reverse recovery current - 10.8 a t rr reverse recovery time i sd = 3 a, di/dt = 100 a/s v dd = 60 v, t j = 150 c (see figure 16: "test circuit for inductive load switching and diode recovery times" ) - 494 ns q rr reverse recovery charge - 2.45 c i rrm reverse recovery current - 9.9 a notes: (1) pulse width limited by safe operating area (2) pulsed: pulse duration = 300 s, duty cycle 1.5% table 9: gate - source zener diode symbol parameter test conditions min. typ. max. unit v (br)gso gate - source breakdown voltage i gs = 1 ma,i d = 0 a 30 - - v the built - in back - to - back zener diodes are specifically designed to enhance the esd performance of the device. the zener voltage facilitates efficient and cost - effective device integrity protection, thus eliminating the need for additional external componentry.
electrical characteristics STF4N90K5 6 / 13 docid029957 rev 2 2.1 electrical characteristics (curves) figure 2 : safe op erating area figure 3 : thermal impedance figure 4 : output characteristics figure 5 : transfer characteristics figure 6 : gate charge vs gate - source voltage figure 7 : static drain - source on - resistance
STF4N90K5 electrical characteristics docid029957 rev 2 7 / 13 figure 8 : capacitance variations figure 9 : normalized gate threshold voltage vs temperature figure 10 : normalized on - resistance vs temperature figure 11 : normalized v(br)dss vs temperature figure 12 : maximum avalanche energy vs starting tj figure 13 : source - drain diode forward characteristics
test circuits STF4N90K5 8 / 13 docid029957 rev 2 3 test circuits figure 14 : test circuit for resistive load switching times figure 15 : test circuit for gate charge behavior figure 16 : test circuit for inductive load switching and diode recovery times figure 17 : unclamped inductive load test circuit figure 18 : unclamped inductive waveform figure 19 : switching time waveform am01469v10 47 k 2.7 k 1 k i g = cons t 100 d.u. t . + pulse width v gs 2200 f v g v dd r l
STF4N90K5 package information docid029957 rev 2 9 / 13 4 package information in order to meet environmental requirements, st offers these devices in different grades of ecopack ? packages, depending on their level of environmental compliance. ecopack ? speci fications, grade definitions and product status are available at: www.st.com . ecopack ? is an st trademark.
package information STF4N90K5 10 / 13 docid029957 rev 2 4.1 to - 220fp package information figure 20 : t o - 220fp package outline
STF4N90K5 package information docid029957 rev 2 11 / 13 table 10: to - 220fp package mechanical data dim. mm min. typ. max. a 4.4 4.6 b 2.5 2.7 d 2.5 2.75 e 0.45 0.7 f 0.75 1 f1 1.15 1.70 f2 1.15 1.70 g 4.95 5.2 g1 2.4 2.7 h 10 10.4 l2 16 l3 28.6 30.6 l4 9.8 10.6 l5 2.9 3.6 l6 15.9 16.4 l7 9 9.3 dia 3 3.2
revision history STF4N90K5 12 / 13 docid029957 rev 2 5 revision history table 11: document revision history date revision changes 02 - nov - 2016 1 first release. 23 - nov - 2016 2 updated figure 2: "safe operating area" . minor text changes.
STF4N90K5 docid029957 rev 2 13 / 13 important notice C please read carefully stmicroelectronics nv and its subsidiaries (st) reserve the right to make changes, corrections, enhancements, modifications , and improvements to st products and/or to this document at any time without notice. purchasers should obtain the latest relevant information on st products before placing orders. st products are sold pursuant to sts terms and conditions of sale in place at the time of or der acknowledgement. purchasers are solely responsible for the choice, selection, and use of st products and s t assumes no liability for application assistance or the design of purchasers products. no license, express or implied, to any intellectual property right is granted by st herein. resale of st products with provisions different from the information se t forth herein shall void any warranty granted by st for such product. st and the st logo are trademarks of st. all other product or service names are the property of their respective owners. information in this document supersedes and replaces information previously supplied in any prior versions of this document. ? 2016 stmicroelectronics C all rights reserved

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